AFM
Lab unit & Contact: Experimental Analysis Lab
AFM (Atom Force Microscope):
Characterization and imaging of almost any type surface topographies
| Device type: | Multimode III |
| Manufacturer: | Bruker |
| Analysis: | Sample topography and magnetism measurements |
| Sample type: | Solids |
| Sample amount: | Dependent on analysis required, typically < 1 gram |
| Sample preparation: | Samples must have a surface roughness of less than 1 µm height difference and be mountable on a disk that allows the sample surface to have minimal slope with respect to the apparatus |
| Location: | VMB 1.18 |