EPMA (Microprobe)
Read more about our national EPMA facility
EPMA (Electron Probe Micro Analyzer):
Non-destructive method to determine element concentrations of solid materials on spots as small as 1-2 microns
| Device type: | JEOL JXA-8530F Hyperprobe |
| Manufacturer: | JEOL |
| Analysis: | Quantitative spot measurements / Qualitative and quantitative element distribution maps / Cathodoluminescence (CL) images |
| Sample type: | Solid materials including upper rocks, sediments, fossils, meteorites, and experimentally produced samples |
| Sample amount: | Rectangular thin sections (25 x 48 mm) and 1-inch rounds |
| Sample preparation: | Well-polished and carbon-coated thin sections |
| Location: | VMB 1.06 |